This paper defines a method to measure the chip die pad capacitance using time delay reflectometry (TDR). This method is useful for measuring the low-value capacitance that is present at the end of a ...
High-voltage capacitance-voltage (HV C-V) measurements are an increasingly important for characterizing the latest generation of wide-bandgap power semiconductor devices because the measurements are ...
A recently filed patent (Publication Number: US20230314495A1) describes a capacitance measurement circuit that includes an analog front-end circuit, a parasitic capacitor, an analog to digital ...
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