Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
Wistron has adopted AI technology to inspect defects of products at three of its factories and will extend such inspection to other plants, according to company senior software manger Liang Wei-quo.
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
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